论文标题
dynunlock：使用动态键解锁扫描链混淆
DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys
论文作者
论文摘要
半导体行业的外包为更快，更具成本效益的芯片制造业开辟了场所。但是，这也引入了具有恶意意图的不信任实体，以窃取知识产权（IP），过量生产电路，插入硬件木马或伪造芯片。最近，提出了一种防御，以基于动态键来混淆扫描访问，该键最初是从秘密键生成的，但每个时钟周期都会改变。这种防御可以被认为是所有扫描锁定技术中最严格的防御。在本文中，我们提出了一项攻击，将这种防御重塑为SAT攻击可能会破坏的辩护，而我们还指出，我们的攻击也可以调整以破坏其他较少严格的（键较少更新的键）扫描锁定技术。
Outsourcing in semiconductor industry opened up venues for faster and cost-effective chip manufacturing. However, this also introduced untrusted entities with malicious intent, to steal intellectual property (IP), overproduce the circuits, insert hardware Trojans, or counterfeit the chips. Recently, a defense is proposed to obfuscate the scan access based on a dynamic key that is initially generated from a secret key but changes in every clock cycle. This defense can be considered as the most rigorous defense among all the scan locking techniques. In this paper, we propose an attack that remodels this defense into one that can be broken by the SAT attack, while we also note that our attack can be adjusted to break other less rigorous (key that is updated less frequently) scan locking techniques as well.
