论文标题

表面代码上泄漏错误的关键故障

Critical faults of leakage errors on the surface code

论文作者

Brown, Natalie C., Cross, Andrew W., Brown, Kenneth R.

论文摘要

泄漏是一个特别有害的误差,当Qubit留下定义的计算子空间时会发生。泄漏错误通过将其他错误传播到其他量子位和损坏综合征测量值来限制量子错误纠正代码的有效性。在各种情况下,已经研究了泄漏错误对表面代码的影响。但是,泄漏的数据Qubit与泄漏的Ancilla量子置量的效果可能会大不相同。在这里,我们分别研究了数据泄漏和Ancilla泄漏的影响。我们表明数据泄漏的破坏性要小得多。我们表明,通过将泄漏限制在数据量量位或消除关键故障位置处的Aniclla量度泄漏,表面代码在存在泄漏的情况下保持其距离。我们还通过使用带有单方面泄漏的门并将两种类型的泄漏减少电路介绍了新技术来处理泄漏:一种用于处理数据泄漏,另一种用于处理Ancilla泄漏。

Leakage is a particularly damaging error that occurs when a qubit leaves the defined computational subspace. Leakage errors limit the effectiveness of quantum error correcting codes by spreading additional errors to other qubits and corrupting syndrome measurements. The effects of leakage errors on the surface code has been studied in various contexts. However, the effects of a leaked data qubit versus a leaked ancilla qubit can be quite different. Here, we study the effects of data leakage and ancilla leakage separately. We show that data leakage is much less damaging. We show that the surface code maintains its distance in the presence of leakage by either confining leakage to data qubits or eliminating aniclla qubit leakage at the critical fault location. We also introduce new techniques for handling leakage by using gates with one-sided leakage and by mixing two types of leakage reducing circuits: one to handle data leakage and one to handle ancilla leakage.

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