论文标题

电子显微镜快速检测器的下一代信息技术系统

Next-Generation Information Technology Systems for Fast Detectors in Electron Microscop

论文作者

Weber, Dieter, Clausen, Alexander, Dunin-Borkowski, Rafal E.

论文摘要

GATAN K2是直接电子检测器(Gatan Inc.,2018年),该检测器于2014年推出,标志着用于开发用于传输电子显微镜(TEM)相机开发的流域时刻(Pan&Czarnik,2016年)。它的像素频率,即每秒记录的数据点(像素)的数量,比五年前可用的最快摄像机高两个数量级。从2009年开始,TEM摄像机的数据速率已超过网络,质量存储和内存带宽的开发,将近两个数量级。因此,基于个人计算机(PC)的解决方案在此之前还不再能够处理所得的数据速率。取而代之的是,需要定制的高性能设置。诸如欧洲XFEL之类的高级X射线源也发生了类似的发展,需要用于数据处理的特殊信息技术(IT)系统(Sauter,Hattne,Grosse-Kunstleve和Echols,2013年)(Fangohr等,2013)。信息和检测器技术目前正在快速发展,涉及破坏性的技术创新。本章简要回顾了过去20年的技术发展,并在2019年初介绍了当前情况的快照,并期待着未来的发展。

The Gatan K2 IS direct electron detector (Gatan Inc., 2018), which was introduced in 2014, marked a watershed moment in the development of cameras for transmission electron microscopy (TEM) (Pan & Czarnik, 2016). Its pixel frequency, i.e. the number of data points (pixels) recorded per second, was two orders of magnitude higher than the fastest cameras available only five years before. Starting from 2009, the data rate of TEM cameras has outpaced the development of network, mass storage and memory bandwidth by almost two orders of magnitude. Consequently, solutions based on personal computers (PCs) that were adequate until then are no longer able to handle the resulting data rates. Instead, tailored high-performance setups are necessary. Similar developments have occurred for advanced X-ray sources such as the European XFEL, requiring special information technology (IT) systems for data handling (Sauter, Hattne, Grosse-Kunstleve, & Echols, 2013) (Fangohr, et al., 2018). Information and detector technology are currently under rapid development and involve disruptive technological innovations. This chapter briefly reviews the technological developments of the past 20 years, presents a snapshot of the current situation at the beginning of 2019 with many practical considerations, and looks forward to future developments.

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