论文标题
架构嘈杂的中间尺度被困的离子量子计算机
Architecting Noisy Intermediate-Scale Trapped Ion Quantum Computers
论文作者
论文摘要
被困的离子(TI)是构建嘈杂的中间量子量子(NISQ)硬件的领先候选人。 Ti Qubits比其他技术具有基本优势,例如超导量子位,包括高量子质量,连贯性和连接性。但是,当前的Ti系统的尺寸较小,具有5-20 QUAT,通常使用具有基本可伸缩性限制的单个陷阱体系结构。为了朝着50-100 Qubits的下一个主要里程碑进行迈进,已经提出了一个模块化架构,称为量子电荷耦合设备(QCCD)。在基于QCCD的Ti设备中,小陷阱通过离子穿梭连接。尽管已经证明了此类设备的基本硬件组件,但构建50-100个Qubit系统是具有挑战性的,因为陷阱尺寸,通信拓扑和栅极实现的各种设计可能性以及符合多样化的应用程序资源需求的需求。 为了实现使用50-100吨的QCCD系统,我们进行了一项广泛的建筑研究,评估了陷阱尺寸,通信拓扑和操作实施方法的关键设计选择。我们构建了一个设计工具流,该工具流将QCCD体系结构的参数作为输入以及一组应用程序和现实的硬件性能模型。我们的工具流将应用程序映射到目标设备上,并模拟其执行,以计算指标,例如运行时间,可靠性和设备噪声速率。使用六个应用程序和几个硬件设计点,我们表明陷阱尺寸和通信拓扑选择可以通过多达三个数量级影响应用程序可靠性。微构造门实施选择会通过另一个数量级影响可靠性。从这些研究中,我们提供了具体的建议来调整这些选择,以实现高度可靠和性能的应用程序执行。
Trapped ions (TI) are a leading candidate for building Noisy Intermediate-Scale Quantum (NISQ) hardware. TI qubits have fundamental advantages over other technologies such as superconducting qubits, including high qubit quality, coherence and connectivity. However, current TI systems are small in size, with 5-20 qubits and typically use a single trap architecture which has fundamental scalability limitations. To progress towards the next major milestone of 50-100 qubits, a modular architecture termed the Quantum Charge Coupled Device (QCCD) has been proposed. In a QCCD-based TI device, small traps are connected through ion shuttling. While the basic hardware components for such devices have been demonstrated, building a 50-100 qubit system is challenging because of a wide range of design possibilities for trap sizing, communication topology and gate implementations and the need to match diverse application resource requirements. Towards realizing QCCD systems with 50-100 qubits, we perform an extensive architectural study evaluating the key design choices of trap sizing, communication topology and operation implementation methods. We built a design toolflow which takes a QCCD architecture's parameters as input, along with a set of applications and realistic hardware performance models. Our toolflow maps the applications onto the target device and simulates their execution to compute metrics such as application run time, reliability and device noise rates. Using six applications and several hardware design points, we show that trap sizing and communication topology choices can impact application reliability by up to three orders of magnitude. Microarchitectural gate implementation choices influence reliability by another order of magnitude. From these studies, we provide concrete recommendations to tune these choices to achieve highly reliable and performant application executions.