论文标题
$^{210} $ pb的清除，由结晶探测器侧壁蚀刻
Removal of $^{210}$Pb by Etch of Crystalline Detector Sidewalls
论文作者
论文摘要
许多罕见事件搜索或筛选探测器的主要背景的潜在来源来自ra仪，特别是$^{210} $ pb，通常在检测器制造过程中存放在检测器表面上。执行后期蚀刻是具有挑战性的，因为它可能会损坏检测器。本文介绍了一种后期蚀刻技术，可降低表面$^{210} $ pb和$^{210} $ po by $> 99 \ times $ $> 90％c.l.
A potential source of dominant backgrounds for many rare-event searches or screening detectors is from radon daughters, specifically $^{210}$Pb, deposited on detector surfaces, often during detector fabrication. Performing a late-stage etch is challenging because it may damage the detector. This paper describes a late-stage etching technique that reduces surface $^{210}$Pb and $^{210}$Po by $>99\times$ at 90% C.L.
