论文标题
从表面旨在的超级速度单一敏感探测器的低质量，遗物暗物质候选者的限制
Constraints on low-mass, relic dark matter candidates from a surface-operated SuperCDMS single-charge sensitive detector
论文作者
论文摘要
本文使用第二代SuperCDMS高压EV分辨率检测器提出了分析和对光暗物质的限制，并在深色暗物质上散射出来。 0.93克Si检测器达到了3 eV的声子能量分辨率。对于100V的检测器偏置，这对应于单个电子孔对的3％的电荷分辨率。据报道，通过在地上实验室中获得的1.2克暴露时间的盲目分析报告。随着电荷载体捕获和冲击电离效应纳入了暗物质信号模型，深色电子横截面$ \barσ_{e} $受到暗物质质量的约束，限制为0.5- $ 10^{4} $ MEV $/c $/c^{2} $;在质量范围内，从1.2---50 eV $/c^{2} $限制了深色光子动力子混合参数$ \ varepsilon $和Axioelectric耦合常数$ g_ {ae} $受到限制。上述质量范围内的最低90％置信度的上限为$ \barσ_{e} \，= \，8.7 \ times10^{ - 34} $ cm $^{2} $，$ \ varepsilon \， $ g_ {ae} \，= \，1.0 \ times10^{ - 9} $。
This article presents an analysis and the resulting limits on light dark matter inelastically scattering off of electrons, and on dark photon and axion-like particle absorption, using a second-generation SuperCDMS high-voltage eV-resolution detector. The 0.93 gram Si detector achieved a 3 eV phonon energy resolution; for a detector bias of 100 V, this corresponds to a charge resolution of 3% of a single electron-hole pair. The energy spectrum is reported from a blind analysis with 1.2 gram-days of exposure acquired in an above-ground laboratory. With charge carrier trapping and impact ionization effects incorporated into the dark matter signal models, the dark matter-electron cross section $\barσ_{e}$ is constrained for dark matter masses from 0.5--$10^{4} $MeV$/c^{2}$; in the mass range from 1.2--50 eV$/c^{2}$ the dark photon kinetic mixing parameter $\varepsilon$ and the axioelectric coupling constant $g_{ae}$ are constrained. The minimum 90% confidence-level upper limits within the above mentioned mass ranges are $\barσ_{e}\,=\,8.7\times10^{-34}$ cm$^{2}$, $\varepsilon\,=\,3.3\times10^{-14}$, and $g_{ae}\,=\,1.0\times10^{-9}$.
