论文标题
观察来自声子浴的电子脱钩的观察，靠近相关驱动的金属绝缘体过渡
Observation of decoupling of electrons from phonon bath close to a correlation driven metal-insulator transition
论文作者
论文摘要
我们观察到，在较小的温度范围内接近莫特过渡，缓慢的放松的优势导致电子与热浴的脱钩。通过观察Mott System薄膜中的热噪声的大偏差$ ndnio_ {3} $从规范的Johnson-nyquist值$ 4K_ {B} TR $接近过渡的情况下，这已经确定了这一点。建议在绝缘阶段，以充电能为控制参数的纳米金属相（估计尺寸$ \ sim $ 15-20 nm）产生了如此大的噪声。
We observed that close to a Mott transition, over a small temperature range, the predominance of slow relaxations leads to decoupling of electrons from the thermal bath. This has been established by observation of large deviation of the thermal noise in the films of Mott system $NdNiO_{3}$ from the canonical Johnson-Nyquist value of $4k_{B}TR$ close to the transition. It is suggested that such a large noise arise from small isolated pockets of nanometric metallic phases (estimated size $\sim$ 15-20 nm) within the insulating phase with the charging energy as the control parameter.
