论文标题

150KeV和590KeV质子辐照对单层MOS2的影响

Impact of 150keV and 590keV proton irradiation on monolayer MoS2

论文作者

Ozden, Burcu, Khan, Ethan, Uprety, Sunil, Zhang, Tianyi, Razon, Joseph, Wang, Ke, Isaacs-Smith, Tamara, Park, Minseo, Terrones, Mauricio

论文摘要

我们介绍了一项有关质子照射在不同能量(150和590 KEV)的影响的全面研究,其通量为1x 1012质子/cm2对单层MOS2。这项研究不仅提高了我们对高能质子束对MOS2的影响的理解,而且对辐射诱导的多层MOS2起始材料设备的设备处理和设备工程的变化具有影响。从光致发光光谱研究中观察到随着质子照射能量降低而增加的缺陷密度。这些缺陷归因于通过X射线光电子光谱分析观察到的硫空位,并通过透射电子显微镜成像确认。扫描电子显微镜图像显示质子照射后的晶界产生。通过原子力显微镜检测到较低的辐照能检测到较高程度的表面变形。通过透射电子显微镜成像估计的质子能照射的增加,缺失间距离增加。拉曼光谱揭示了辐照后晶体质量的结构变化可忽略不计。由于质子辐照引起的这些变形损坏在MOS2层上微不足道。基于低能质子辐照对材料特性的总体影响,ML-MOS2材料可被视为可靠的可靠的基于2D材料的设备用于空间应用。

We present a comprehensive study on the effects of proton irradiation at different energies (150 and 590 keV) with the fluence of 1x 1012 proton/cm2 on monolayer MoS2. This study not only improves our understanding of the influence of high-energy proton beams on MoS2 but also has implications for radiation-induced changes in device processing and engineering of devices from multilayer MoS2 starting material. Increasing defect density with decreasing proton irradiation energy was observed from photoluminescence spectroscopy study. These defects are attributed to sulfur vacancies observed through x-ray photoelectron spectroscopy analysis and confirmed by transmission electron microscope imaging. Scanning electron microscopy images showed the creation of grain boundaries after proton irradiation. A higher degree of surface deformation was detected with lower irradiation energies through atomic force microscopy. Inter-defect distance is increased with the increase in proton energy irradiation as estimated by transmission electron microscopy imaging. Raman spectroscopy reveals negligible structural changes in the crystal quality after the irradiation. These deformation damages due to proton irradiation are insignificant at the MoS2 layer. Based on the overall influence of low energy proton irradiation on the material characteristics, ML-MoS2 materials can be considered robust and reliable building blocks for 2D material based devices for space applications.

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