论文标题
Delta-t噪声中的昆多政权
Delta-T noise in the Kondo regime
论文作者
论文摘要
我们研究了Kondo状态中的Delta-T噪声，这意味着SU（2）Kondo量子点的温度偏置下的电荷电流噪声。我们提出了一个实验可测量的数量，以量化delta-t噪声中的低温特性：$ s _ {\ ell} = s（t _ {\ mathrm {l}}，t _ {\ mathrm {r}}） - （1/2）[S（T _ {\ Mathrm {l}}，T _ {\ Mathrm {l}}）） + S（T _ {\ Mathrm {r}}，T _ {\ Mathrm {r}}}] $，这产生了射击的噪声限制。我们计算了粒子孔对称情况下的SU（2）近代量子点的量。我们发现$ s _ {\ ell} $在质量上表现出与电化学潜在偏见的情况和温度有偏见的情况相同的行为。定量差异似乎是噪声系数的差异，这反映了费米分布函数的差异：电化学电位有偏见或温度有偏见。
We study the delta-T noise in the Kondo regime, which implies the charge current noise under the temperature bias for the SU(2) Kondo quantum dot. We propose an experimentally measurable quantity to quantify the low-temperature properties in the delta-T noise: $S_{\ell}=S(T_{\mathrm{L}},T_{\mathrm{R}}) - (1/2)[S(T_{\mathrm{L}},T_{\mathrm{L}}) + S(T_{\mathrm{R}},T_{\mathrm{R}})]$, which yields the shot noise expression in the noninteracting limit. We calculate this quantity for the SU(2) Kondo quantum dot in the particle-hole symmetric case. We found that the $S_{\ell}$ exhibits qualitatively the same behavior in both the electrochemical potential biased case and the temperature biased case. The quantitative difference appears as a difference of the coefficients of the noises, which reflects the difference of the Fermi distribution function: electrochemical potential biased or temperature biased.
