论文标题
Pychography中的参数检索方法
Parameter retrieval methods in ptychography
论文作者
论文摘要
我们提出了一种参数检索方法，该方法结合了Ptychography和有关对象的其他先验知识。所提出的方法应用于两个应用：（1）从傅立叶ptychographic暗场测量中检索小颗粒的参数； （2）带有真实空间ptychography的重晶的参数检索。在本文的第二部分中讨论了泊松噪声的影响。在两种应用中，CramérRao的下限都计算出来，并使用蒙特卡洛分析来验证计算出的下限。通过计算结果，我们报告了各种噪声水平的下限以及应用1中粒子的相关性。对于应用2，讨论了矩形参数的相关性。
We present a parameter retrieval method which combines ptychography and additional prior knowledge about the object. The proposed method is applied to two applications: (1) parameter retrieval of small particles from Fourier ptychographic dark field measurements; (2) parameter retrieval of retangule with real-space ptychography. The influence of Poisson noise is discussed in the second part of the paper. The Cramér Rao Lower Bound in both two applications is computed and Monte Carlo analysis is used to verify the calculated lower bound. With the computation results we report the lower bound for various noise levels and the correlation of particles in Application 1. For Application 2 the correlation of parameters of the rectangule is discussed.
