学术文献库

Characterizing the noise in the set of gate operations that form the building blocks of a quantum computational device is a necessity for assessing the quality of the device. Here, we introduce randomized linear gate set tomography, an easy-to-implement gate set tomography procedure that combines the idea of state-preparation-and-measurement-error-free characterization of standard gate set tomography with no-design randomized tomographic circuits and computational ease brought about by an appropriate linear approximation. We demonstrate the performance of our scheme through simulated examples as well as experiments done on the IBM Quantum Experience Platform. In each case, we see that the performance of our procedure is comparable with that of standard gateset tomography, while requiring no complicated tomographic circuit design and taking much less computational time in deducing the estimate of the noise parameters. This allows for straightforward on-the-fly characterization of the gate operations in an experiment.