论文标题
电子显微镜研究绘制诱导的表面微观结构在Al-Cu-fe二十叶型准晶体中
Electron microscopy study of scratch-induced surface microstructures in an Al-Cu-Fe icosahedral quasicrystal
论文作者
论文摘要
通过扫描电子显微镜（SEM）和透射电子显微镜（TEM）研究了通过在单相alcufe Icosicrystal（IQC）表面上滑动WC-CO缩进器在刮擦测试中诱导的微观结构修饰。显示了刮擦轨道，显示了许多较小的轨道。发现位错是从较小的刮擦轨道的边缘出现的。沿着剪切应力浓缩的小轨道，指出了从IQC到以身体为中心的立方（B.C.C.）相的相过渡，并指出了带有晶格参数A = 0.29 nm的相位。在划痕下方的区域确定了调制的准晶体和IQC的变形双胞胎。
Microstructure modifications induced by sliding a WC-Co indenter in scratch tests on the surface of a single phase AlCuFe icosahedral quasicrystal (IQC) was studied by scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The scratch track was shown tocomprise many smaller tracks. Dislocations were discovered to emerge from the edges of the smaller scratch tracks. Along a small track where shear stress is concentrated, a phase transition from IQC to a body-centered cubic (b.c.c.) phase with lattice parameter a=0.29 nm was pointed out. A modulated quasicrystal state as well as a deformation twin of IQC were determined in the region beneath the scratch.
