论文标题
PRISA：一个简单的软件，用于确定折射率，灭绝同时，分散能，带隙以及半导体和介电薄膜的厚度
PRISA: a simple software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films
论文作者
论文摘要
已经开发了一种简单的用户友好软件，以确定光学常数（折射率和灭绝协调能力），分散参数（振荡器能量和分散能），吸收共同的共同效果，半导体的带隙和厚度，仅从其测量的传输谱中，仅来自其测量的传输谱。使用Swanepoel提出的包络方法得出了膜的厚度，折射率和消光的薄膜的灭绝。使用Connel和Lewis提出的方法计算强吸收区域中的吸收效率。随后，使用TAUC图从吸收率高的光谱估算了膜的直接和间接带隙。该软件的代码是用Python编写的，图形用户界面是使用Python的TKINTER软件包编程的。它提供了可测量和派生数据的方便输入和输出。该软件具有使用派生参数来检索传输频谱的功能，以检查其可靠性。通过分析A-SI：H无定形半导体薄膜的数值生成的传输光谱以及实验测量的电子束蒸发的HFO2介电薄膜的透射光谱来验证该软件的性能。与其他免费可用的软件相比，发现Prisa更简单和准确。为了帮助其他研究薄膜的研究人员，该软件是在https://www.shuvendujena.tk/download中免费提供的。
A simple user-friendly software named PRISA has been developed to determine optical constants (refractive index and extinction co-efficient), dispersion parameters (oscillator energy and dispersion energy), absorption co-efficient, band gap and thickness of semiconductor and dielectric thin films from their measured transmission spectrum, only. The thickness, refractive index, and extinction co-efficient of the films have been derived using Envelope method proposed by Swanepoel. The absorption co-efficient in the strong absorption region is calculated using the method proposed by Connel and Lewis. Subsequently, both direct and indirect bandgap of the films is estimated from the absorption co-efficient spectrum using Tauc plot. The codes for the software are written in Python and the graphical user interface is programmed with tkinter package of Python. It provides convenient input and output of the measured and derived data. The software has a feature to retrieve transmission spectrum using the derived parameters in order to check their reliability. The performance of the software is verified by analyzing numerically generated transmission spectra of a-Si:H amorphous semiconductor thin films, and experimentally measured transmission spectra of electron beam evaporated HfO2 dielectric thin films as examples. PRISA is found to be much simpler and accurate as compared to the other freely available softwares. To help other researchers working on thin films, the software is made freely available at https://www.shuvendujena.tk/download.
