论文标题
脉冲宽度和温度依赖性的旋转式轨道扭矩开关
Pulse-width and Temperature Dependence of Memristive Spin-Orbit Torque Switching
论文作者
论文摘要
至关重要的是,由磁异质结构形成的磁记忆设备具有相当大的自旋轨道扭矩(SOT)效率和高热稳定性,以实现有效的SOT控制和此类内存设备的强大存储。但是,大多数先前关于各种磁异质结构的研究仅集中在其SOT效率上,而其中的热稳定性在很大程度上被忽略了。在这项工作中,我们研究了两种基于W的异质结构的温度依赖性SOT和稳定性特性,即W/COFEB/MGO(标准)和COFEB/W/COFEB/MGO(FIELD-FREE),来自25 ^{\ circect} c(298 K)c(298 K)至80 ^{\ cirp cirp} c(\ cirp} c(353 k)。通过温度依赖的SOT表征,发现两个系统的SOT效率在研究温度范围内是不变的。依赖温度的电流引起的SOT开关测量结果进一步表明,临界切换电流密度相对于环境温度降低。还发现,随着标准系统和无现场系统的温度升高,热稳定性因子(δ)也会降解。还检查了两个具有各种脉冲宽度和温度的系统中的回忆SOT切换行为。我们的结果表明,尽管SOT疗效对热效应是可靠的,但是在升高温度下δ的降低可能对标准记忆以及神经形态(Memristive)设备应用有害。
It is crucial that magnetic memory devices formed from magnetic heterostructures possess sizable spin-orbit torque (SOT) efficiency and high thermal stability to realize both efficient SOT control and robust storage of such memory devices. However, most previous studies on various types of magnetic heterostructures have focused on only their SOT efficiencies, whereas the thermal stabilities therein have been largely ignored. In this work, we study the temperature-dependent SOT and stability properties of two types of W-based heterostructures, namely W/CoFeB/MgO (standard) and CoFeB/W/CoFeB/MgO (field-free), from 25 ^{\circ}C (298 K) to 80 ^{\circ}C (353 K). Via temperature-dependent SOT characterization, the SOT efficacies for both systems are found to be invariant within the range of studied temperatures. Temperature-dependent current-induced SOT switching measurements further show that the critical switching current densities decrease with respect to the ambient temperature; thermal stability factors (Δ) are also found to degrade as temperature increases for both standard and field-free systems. The memristive SOT switching behaviors in both systems with various pulse-widths and temperatures are also examined. Our results suggest that although the SOT efficacy is robust against thermal effects, the reduction of Δ at elevated temperatures could be detrimental to standard memory as well as neuromorphic (memristive) device applications.