论文标题
COPD合金中钯稀释极限的电阻率测试以储存氢
Resistivity testing of palladium dilution limits in CoPd alloys for hydrogen storage
论文作者
论文摘要
钯满足了具有两个主要缺点的有效氢存储材料的大多数要求：它具有相对较低的重为氢密度，并且对于大规模应用而言的昂贵。基于PD的合金应被视为纯PD的可能选择。问题是多少人可以在保留氢吸收能力的同时稀释多种候选材料中的PD浓度。我们证明，薄膜合金样品的电阻率测量可用于定性的高通量筛选，并研究整个钯浓度范围内的氢吸收特性。与钯丰富的合金相反，额外的氢散射表明一定程度的氢含量，稀释的合金膜由于其厚度膨胀而导致的耐药性降低而响应。在稀释到PD的20％的薄型COPD膜中发现了明显的氢吸收的证据。
Palladium satisfies most of the requirements for an effective hydrogen storage material with two major drawbacks: it has a relatively low gravimetric hydrogen density and is prohibitively expensive for large-scale applications. Pd-based alloys should be considered as possible alternatives to a pure Pd. The question is how much one can dilute the Pd concentration in a variety of candidate materials while preserving hydrogen absorption capability. We demonstrate that the resistivity measurements of thin-film alloy samples can be used for a qualitative high-throughput screening and study of the hydrogen-absorbing properties over the entire range of palladium concentrations. Contrary to palladium-rich alloys where additional hydrogen scattering indicates a degree of hydrogen content, the diluted alloy films respond by a decrease of resistance due to their thickness expansion. Evidence of significant hydrogen absorption was found in thin CoPd films diluted to just 20% of Pd.
