论文标题
二维小间隙半导体和强库仑疾病中拓扑绝缘子的电导率
Conductivity of two-dimensional small gap semiconductors and topological insulators in strong Coulomb disorder
论文作者
论文摘要
我们很荣幸在他的95岁生日那时将这篇文章献给伊曼纽尔·拉什巴(Emmanuel Rashba)。在理想的无障碍情况下,二维带隙绝缘子具有等于带隙($δ$)一半的电导率的激活能。但是,运输实验通常在低温下表现出较小的活化能,并且该激活能量与$δ$之间的关系尚不清楚。在这里,我们考虑了含有库仑杂质的基板上二维窄间隙半导体的温度依赖性电导率,主要集中在随机电位$γ\ggΔ$的情况下。我们表明,电导率一般表现出三个机制,只有最高的温度状态表现出反映带隙的激活能。在较低的温度下,传导通过该疾病产生的电子和孔洞之间的最接近邻居或可变范围跳跃进行。我们表明,与这些过程相关的激活能量和特征温度在关键的杂质浓度附近陡峭崩溃。较大的浓度导致指数较小的活化能和指数较长的定位长度,在介质样品中可以作为疾病诱导的绝缘体到金属转变。我们在三维拓扑绝缘子的薄膜中驱动了类似的疾病驱动的陡峭的绝缘体金属过渡,具有非常大的介电常数,由于电场内部库仑杂质的限制,因此产生了更大的疾病潜力。远离中立点,这种非常规的绝缘体到金属的过渡会通过较小的杂质浓度来增强,因此我们达到了障碍驱动的重新进入金属 - 绝缘体金属型转换。
We are honored to dedicate this article to Emmanuel Rashba on the occasion of his 95 birthday. In the ideal disorder-free situation, a two-dimensional band gap insulator has an activation energy for conductivity equal to half the band gap, $Δ$. But transport experiments usually exhibit a much smaller activation energy at low temperature, and the relation between this activation energy and $Δ$ is unclear. Here we consider the temperature-dependent conductivity of a two-dimensional narrow gap semiconductor on a substrate containing Coulomb impurities, mostly focusing on the case when amplitude of the random potential $Γ\gg Δ$. We show that the conductivity generically exhibits three regimes and only the highest temperature regime exhibits an activation energy that reflects the band gap. At lower temperatures, the conduction proceeds through nearest-neighbor or variable-range hopping between electron and hole puddles created by the disorder. We show that the activation energy and characteristic temperature associated with these processes steeply collapse near a critical impurity concentration. Larger concentrations lead to an exponentially small activation energy and exponentially long localization length, which in mesoscopic samples can appear as a disorder-induced insulator-to-metal transition. We arrive at a similar disorder driven steep insulator-metal transition in thin films of three-dimensional topological insulators with very large dielectric constant, where due to confinement of electric field internal Coulomb impurities create larger disorder potential. Away from neutrality point this unconventional insulator-to-metal transition is augmented by conventional metal-insulator transition at small impurity concentrations, so that we arrive at disorder-driven re-entrant metal-insulator-metal transition.