论文标题
深度分辨的LAUE微屈光度和编码施加
Depth-resolved Laue microdiffraction with coded-apertures
论文作者
论文摘要
我们引入了一种快速的数据采集和重建方法，以使用LAUE衍射在微米分辨率下对材料的结构以及相关应变和方向进行成像。我们的方法依赖于从宽带照明中扫描衍射的X射线梁的编码孔，以及重建算法以解决沿入射照明路径的深度的LAUE微屈光模式。此方法可快速访问散装材料中亚微米量元素的完整衍射信息。在这里，我们介绍了这种成像方法的理论以及实验验证。
We introduce a rapid data acquisition and reconstruction method to image the crystalline structure of materials and associated strain and orientations at micrometer resolution using Laue diffraction. Our method relies on scanning a coded-aperture across the diffracted x-ray beams from a broadband illumination, and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. This method provides a rapid access to full diffraction information at sub-micrometer volume elements in bulk materials. Here we present the theory as well as the experimental validation of this imaging approach.
