论文标题
系统研究厚宝石中的临界电荷极限
Systematic investigation of critical charge limits in Thick GEMs
论文作者
论文摘要
我们介绍了用单个厚的气体乘数（THGEM）进行的排放概率研究，该研究用AR-CO $ _2 $和NE-CO $ _2 $混合物的α颗粒照射。我们观察到排放稳定性对贵族气体和淬火剂含量的明显依赖性，表明较轻的气体对流媒体排放的发展更加稳定。对Geant4模拟的测量值进行了详细的比较，使我们能够提取临界电荷值，从而导致Thgem孔中形成火花，该孔在3-7 $ \ times10^6 $电子的范围内，取决于气体混合物。 我们的实验发现与以前的GEM结果进行了比较。我们表明，THGEM的放电概率超过了按照数量级测量的GEM的排放概率。这可以用简单的几何考虑来解释，其中通过在THGEM结构中可用的孔数量较低，达到较高的一级电荷密度，从而增加了火花出现的可能性。但是，我们表明两个放大结构的关键电荷限量相似。
We present discharge probability studies performed with a single Thick Gas Electron Multiplier (THGEM) irradiated with alpha particles in Ar-CO$_2$ and Ne-CO$_2$ mixtures. We observe a clear dependency of the discharge stability on the noble gas and quencher content pointing to lighter gases being more stable against the development of streamer discharges. A detailed comparison of the measurements with Geant4 simulations allowed us to extract the critical charge value leading to the formation of a spark in a THGEM hole, which is found to be within the range of 3-7$\times10^6$ electrons, depending on the gas mixture. Our experimental findings are compared to previous GEM results. We show that the discharge probability of THGEMs exceeds the one measured with GEMs by orders of magnitude. This can be explained with simple geometrical considerations, where primary ionization is collected by a lower number of holes available in a THGEM structure, reaching higher primary charge densities and thus increasing the probability of a spark occurrence. However, we show that the critical charge limits are similar for both amplification structures.
