论文标题
研究BTI，HCI和时间零变异性对神经形态尖峰事件生成电路的影响
Investigating the impact of BTI, HCI and time-zero variability on neuromorphic spike event generation circuits
论文作者
论文摘要
神经形态计算是指脑启发的计算机，将其与von Neumann架构区分开来。基于模拟VLSI的神经形态回路是当前的研究兴趣。两个简单的尖峰集成和火神经元模型，即轴突 - 希洛克（AH）和电压集成，而火（VIF）电路通常用于生成尖峰事件。本文讨论了可靠性问题的影响，例如偏置温度不稳定性（BTI）和热载体注入（HCI）以及TimeZero的可变性对这些基于CMO的神经形态电路的影响。 AH和VIF电路是使用基于HKMG的45NM技术实施的。为了可靠性分析，使用行业标准Cadence relxpert工具。对于时间零变异性分析，进行了1000个蒙特卡洛模拟。
Neuromorphic computing refers to brain-inspired computers, that differentiate it from von Neumann architecture. Analog VLSI based neuromorphic circuits is a current research interest. Two simpler spiking integrate and fire neuron model namely axon-Hillock (AH) and voltage integrate, and fire (VIF) circuits are commonly used for generating spike events. This paper discusses the impact of reliability issues like Bias Temperature instability (BTI) and Hot Carrier Injection (HCI), and timezero variability on these CMOS based neuromorphic circuits. AH and VIF circuits are implemented using HKMG based 45nm technology. For reliability analysis, industry standard Cadence RelXpert tool is used. For time-zero variability analysis, 1000 Monte-Carlo simulations are performed.
