论文标题
精确的Kohn-Sham辅助系统来自固体的基态密度
Accurate Kohn-Sham auxiliary system from the ground state density of solids
论文作者
论文摘要
Kohn-Sham(KS)系统是一个辅助系统,在大多数情况下,其有效潜力是未知的。它原则上是由基态密度确定的,并且通过从给定的准确密度开始的KS方程来通过数字找到一些低维系统。对于固体,只有近似结果可用。在这项工作中,我们使用从辅助场量子蒙特卡洛计算获得的基态密度来确定Si和NaCl的准确交换相关性(XC)势。我们表明,这些XC电位可以合理化为局部密度的环境适应功能的集合。可以以高精度获得KS带结构。事实证明,真实的KS带隙大于局部密度近似的预测,但明显小于可测量的光发射隙,这证实了先前的估计值。最后,我们的发现表明,在固体中,XC电势可能导致非常相似的XC电位和其他KS可观察物的猜想也是如此,这在固体中也是如此,这质疑了电势细节的含义,同时质疑了KS系统的稳定性。
The Kohn-Sham (KS) system is an auxiliary system whose effective potential is unknown in most cases. It is in principle determined by the ground state density, and it has been found numerically for some low-dimensional systems by inverting the KS equations starting from a given accurate density. For solids, only approximate results are available. In this work, we determine accurate exchange correlation (xc) potentials for Si and NaCl using the ground state densities obtained from Auxiliary Field Quantum Monte Carlo calculations. We show that these xc potentials can be rationalized as an ensemble of environment-adapted functions of the local density. The KS band structure can be obtained with high accuracy. The true KS band gap turns out to be larger than the prediction of the local density approximation, but significantly smaller than the measurable photoemission gap, which confirms previous estimates. Finally, our findings show that the conjecture that very different xc potentials can lead to very similar densities and other KS observables is true also in solids, which questions the meaning of details of the potentials and, at the same time, confirms the stability of the KS system.