Belle II硅顶点检测器的簇位置分辨率的测量

论文标题

Belle II硅顶点检测器的簇位置分辨率的测量

Measurement of the cluster position resolution of the Belle II Silicon Vertex Detector

论文作者

Leboucher, R., Adamczyk, K., Aggarwal, L., Aihara, H., Aziz, T., Bacher, S., Bahinipati, S., Batignani, G., Baudot, J., Behera, P. K., Bettarini, S., Bilka, T., Bozek, A., Buchsteiner, F., Casarosa, G., Corona, L., Czank, T., Das, S. B., Dujany, G., Finck, C., Forti, F., Friedl, M., Gabrielli, A., Ganiev, E., Gobbo, B., Halder, S., Hara, K., Hazra, S., Higuchi, T., Irmler, C., Ishikawa, A., Jeon, H. B., Jin, Y., Joo, C., Kaleta, M., Kaliyar, A. B., Kandra, J., Kang, K. H., Kapusta, P., Kodys, P., Kohriki, T., Kumar, M., Kumar, R., La Licata, C., Lalwani, K., Lee, S. C., Libby, J., Martel, L., Massaccesi, L., Mayekar, S. N., Mohanty, G. B., Morii, T., Nakamura, K. R., Natkaniec, Z., Onuki, Y., Ostrowicz, W., Paladino, A., Paoloni, E., Park, H., Polat, L., Rao, K. K., Ripp-Baudot, I., Rizzo, G., Sahoo, D., Schwanda, C., Serrano, J., Suzuki, J., Tanaka, S., Tanigawa, H., Thalmeier, R., Tiwary, R., Tsuboyama, T., Uematsu, Y., Verbycka, O., Vitale, L., Wan, K., Wang, Z., Webb, J., Wiechczynski, J., Yin, H., Zani, L.

论文摘要

硅顶点探测器（SVD）及其四个双面硅剥离传感器层，是在Superkekb Collider（日本Kek）运营的Belle II的两个顶点子检测器之一。自2019年以来，SVD表现出了可靠且高效的操作，即使在具有世界上最高的瞬时亮度引起的苛刻的光束背景的环境中运行。为了提供有效的模式识别和轨道拟合的最佳质量轨道重建，并正确地传播了曲目参数的命中位置的不确定性，这对于精确估计群集位置测量的分辨率至关重要。将讨论直接从数据估算位置分辨率的几种方法。

The Silicon Vertex Detector (SVD), with its four double-sided silicon strip sensor layers, is one of the two vertex sub-detectors of Belle II operating at SuperKEKB collider (KEK, Japan). Since 2019 and the start of the data taking, the SVD has demonstrated a reliable and highly efficient operation, even running in an environment with harsh beam backgrounds that are induced by the world's highest instantaneous luminosity. In order to provide the best quality track reconstruction with an efficient pattern recognition and track fit, and to correctly propagate the uncertainty on the hit's position to the track parameters, it is crucial to precisely estimate the resolution of the cluster position measurement. Several methods for estimating the position resolution directly from the data will be discussed.

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