论文标题
光的拓扑自旋缺陷
Topological spin defects of light
论文作者
论文摘要
拓扑缺陷在各种系统中都存在，由于它们的拓扑性质，它们的存在在扰动下是可靠的。在这里，我们引入了电磁波中发现的一种新型的拓扑缺陷：拓扑自旋缺陷。这样的缺陷与电磁自旋密度为零的点有关，并且通常具有围绕缺陷点的非平凡拓扑自旋纹理。由于这种自旋纹理，拓扑自旋缺陷具有量化的拓扑电荷。我们提供示例，可以创建孤立的缺陷点，周期性或准周期缺陷晶格。这种拓扑自旋缺陷点可能会在3D成像和纳米颗粒操作中找到应用。
Topological defects are found in a variety of systems, and their existence are robust under perturbations due to their topological nature. Here we introduce a new type of topological defects found in electromagnetic waves: topological spin defects. Such a defect is associated with a point where the electromagnetic spin density is zero, and generically have a nontrivial topological spin texture surrounding the defect point. Due to such spin texture, a topological spin defect possesses a quantized topological charge. We provide examples where isolated defect point, periodic or quasi-periodic defect lattices can be created. Such topological spin defect points may find applications in 3D imaging and nanoparticle manipulation.
