论文标题
基于对数正态寿命下的单发装置测试数据的稳健估计
Robust estimation based on one-shot device test data under log-normal lifetimes
论文作者
论文摘要
在本文中，我们介绍了在日志正态寿命下的一次性设备测试数据的强大估计器。基于这些估计量，还开发了置信区间和WALD型测试。通过模拟研究和两个数值示例来说明它们的鲁棒性特征。
In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a simulation study and two numerical examples.
