论文标题
通过图像的方法,阻抗响应和尺寸依赖性谐振
Impedance responses and size-dependent resonances in topolectrical circuits via the method of images
论文作者
论文摘要
当电容和感应组件一起存在时,会在电路中引起共振。此类共振出现在入学测量中,具体取决于电路的参数和驱动AC频率。在这项研究中,我们分析了非平凡的面向电路的阻抗特征,例如一维su-schrieffer-heeger-heeger电路,并揭示了在有限的$ lc $ lc $ cirditits中不可避免地会出现大小依赖性异常阻抗。通过\ textIt {图像方法},我们研究了如何通过从晶格的结构和边界中的电流反射和干扰来非定修改多维电路阵列中的共振模式。我们得出具有均匀和异质电路元件的各个晶格网络的两个角结中的阻抗的分析表达式。我们还得出了阻抗共振对晶格大小的不规则依赖性,并在三个维度及以上提供了阻抗的积分和尺寸降低的表达式。
Resonances in an electric circuit occur when capacitive and inductive components are present together. Such resonances appear in admittance measurements depending on the circuit's parameters and the driving AC frequency. In this study, we analyze the impedance characteristics of nontrivial topolectrical circuits such as one- and two-dimensional Su-Schrieffer-Heeger circuits and reveal that size-dependent anomalous impedance resonances inevitably arise in finite $LC$ circuits. Through the \textit{method of images}, we study how resonance modes in a multi-dimensional circuit array can be nontrivially modified by the reflection and interference of current from the structure and boundaries of the lattice. We derive analytic expressions for the impedance across two corner nodes of various lattice networks with homogeneous and heterogeneous circuit elements. We also derive the irregular dependency of the impedance resonance on the lattice size, and provide integral and dimensionally-reduced expressions for the impedance in three dimensions and above.