论文标题

在逼真的噪声下见证了被困的离子量子误差校正中的纠缠

Witnessing entanglement in trapped-ion quantum error correction under realistic noise

论文作者

Rodriguez-Blanco, Andrea, Shahandeh, Farid, Bermudez, Alejandro

论文摘要

量子误差校正(QEC)通过将逻辑信息编码为多个物理Qubt来利用冗余。在当前的QEC实现中,不完美的两量纠缠门的序列被用来将信息冗余地整合到多部分纠缠状态中。此外,为了提取错误综合征,使用一系列两Q量门门来构建奇偶校验检查电路。在嘈杂的门的情况下,这两个步骤都不能完美地执行,并且需要提供错误模型来评估QEC的性能。我们提出了一个详细的微观误差模型,以估计被困在离子平台中使用的两数Qubit轻型移动门的平均门不忠。我们在分析上从显微镜参数方面得出了前五的贡献,并提出了有效的错误模型,该模型将现象学帐户中通常使用的错误率连接到特此得出的微观栅极不同意。然后,我们应用这个现实的错误模型来量化由充当QEC构建块的电路生成的多部分纠缠。我们通过使用纠缠证人来做到这一点,以这种方式补充最近的研究,通过探索更现实的微观噪声的影响。

Quantum Error Correction (QEC) exploits redundancy by encoding logical information into multiple physical qubits. In current implementations of QEC, sequences of non-perfect two-qubit entangling gates are used to codify the information redundantly into multipartite entangled states. Also, to extract the error syndrome, a series of two-qubit gates are used to build parity-check readout circuits. In the case of noisy gates, both steps cannot be performed perfectly, and an error model needs to be provided to assess the performance of QEC. We present a detailed microscopic error model to estimate the average gate infidelity of two-qubit light-shift gates used in trapped-ion platforms. We analytically derive leading-error contributions in terms of microscopic parameters and present effective error models that connect the error rates typically used in phenomenological accounts to the microscopic gate infidelities hereby derived. We then apply this realistic error model to quantify the multipartite entanglement generated by circuits that act as QEC building blocks. We do so by using entanglement witnesses, complementing in this way the recent studies by exploring the effects of a more realistic microscopic noise.

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